Chinese

Research

Measuring thin films using quantitative frustrated total internal reflection (FTIR)

2018-11-12

M. Shirota, M.A.J. van Limbeek, D. Lohse, and C. Sun

The European Physical Journal E 40 (5) (2017) 1-9. DOI: 10.1140/epje/i2017-11542-4

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